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Swift/XRT refined analysis of the unidentified INTEGRAL source IGR J16413-4046

ATel #3178; R. Landi, A. Malizia (INAF/IASF Bologna), A. Bazzano, M. Fiocchi (INAF/IASF Rome), A. J. Bird (Univ. Southampton), N. Gehrels (NASA/GSFC)
on 21 Feb 2011; 18:36 UT
Credential Certification: Raffaella Landi (landi@iasfbo.inaf.it)

Subjects: X-ray

Referred to by ATel #: 3342

We report the results of a refined analysis of the Swift/XRT data of the unidentified INTEGRAL source IGR J16413-4046 listed in the 4th IBIS Survey Catalogue (Bird et al. 2010, ApJS, 186, 1).

The X-ray counterpart of this source has already been discussed by Landi et al. (2010, ATel #2731), but the source detection was weak, the positional uncertainty large and no spectral information could be given except for an estimate of the X-ray flux. A more recent XRT observation gives a more significant detection (4.9 sigma confidence level above 3 keV), thus allowing a smaller positional uncertainty and a better characterization of the source X-ray spectrum. The source location at R.A.(J2000) = 16h 41m 19.19s and Dec.(J2000) = -40d 47m 36.6s has an uncertainty of 5.6 arcsec. The X-ray spectrum is well fitted with an absorbed power law (Gamma = 1.8, NH ~ 1023 cm-2) and gives a 2-10 keV flux of 1.4 x 10-12 erg cm-2 s-1.