IGR J17329-2731: Swift/XRT localization and characterization
ATel #10645; E. Bozzo (ISDC, Switzerland), E. Kuulkers (ESA/ESAC, Spain), A. Postel, V. Savchenko (ISDC, Switzerland), C. Sanchez-Fernandez (ESA/ESAC, Spain), R. Wijnands (UVA, Netherlands), K. Pottschmidt (NASA-GSFC/UMBC, USA), V. Beckmann (CNRS/IN2P3, France), A. Bodaghee (GCSU, USA), J. Chenevez (DTU, Denmark)
on 16 Aug 2017; 21:46 UT
Credential Certification: E. Bozzo (email@example.com)
Subjects: X-ray, Transient
The new INTEGRAL transient IGR J17329-2731 (ATel #10644) was observed with Swift/XRT on 2017 August 16 from 2:26 to 2:45 UTC (effective exposure time 1 ks).
A single faint X-ray source (0.07 cts/s) is detected by Swift/XRT within the positional uncertainty provided by INTEGRAL IBIS/ISGRI. The best position obtained from the on-line XRT data analysis tool is at RA, Dec (J2000.0) = 263.20952 deg, -27.50135 deg (the associated 90% confidence level uncertainty is 3.1 arcsec; Evans et al. 2009, MNRAS, 397, 1177).
The XRT spectrum could be preliminarily characterized by an absorbed power-law model, providing indication of a high absorption column density (>1E23 cm^-2) and hard emission (power-law photon index ~0.2). The estimated X-ray flux in the 0.5-10 keV energy band is about 2.5E-11 erg/cm^2/s.
We are grateful to the Swift planning team for the very rapid scheduling of the Swift ToO observation.