XRISM/Xtend Transient Search (XTS) detected an X-ray high state of 2SXPS J171724.0-371717
ATel #17060; H. Sugai (Chuo U.), K. Fukushima, K. Hayashi, Y. Kanemaru, S. Ogawa, T. Yoshida (JAXA), M. Audard (U. de Geneve), E. Behar (Technion), S. Inoue (Kyoto U.), Y. Ishihara (Chuo U.), T. Kohmura (TUS), Y. Maeda (JAXA), M. Mizumoto (UTEF), N. Nagashima (Chuo U.), M. Nobukawa (NUE), K. Pottschmidt (UMBC, NASA GSFC, CRESST), M. Shidatsu (Ehime U.), Y. Terada (Saitama U.), Y. Terashima (Ehime U.), Y. Tsuboi (Chuo U.), H. Uchida (Kyoto U.), T. Yanagi (Chuo U.), T. Yoneyama (Chuo U.), M. Yoshimoto (Osaka U.)
on 2 Mar 2025; 16:39 UT
Credential Certification: Yohko Tsuboi (tsuboi@phys.chuo-u.ac.jp)
Subjects: X-ray, Binary, Transient, Variables
XRISM/Xtend Transient Search (XTS) detected an increase in X-ray intensity from an X-ray source XRISM J1717-3717 on 2025-02-28 TT. The source position is determined to be (R.A., Dec.) = (259.347, -37.28648), with a systematic error of ∼ 40 arcsec. A plausible counterpart is 2SXPS J171724.0-371717, which is located ∼ 11 arcsec apart from the position of XRISM J1717-3717.
The X-ray flux in the 0.4 – 10 keV band increased logarithmically from 2 × 10-12 erg s-1 cm-2 to 7 × 10-12 erg s-1 cm-2 between 2025-02-28 13:30 TT and 2025-02-28 22:30 TT, and remained at the same level until 2025-03-01 15:00 TT.
We estimated the systematic error for the source position from the separations between the detected sources with the corresponding counterparts in the same field of view.
